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together with test methods suitable for determining their magnitude
SEMI G86-0217 (Reapproved 1122)
SEMI D6-0211 (technical revision)
FPD用ガラス基板の有効範囲外に刻印されるマーキングシンボルの位置・寸法・情報量を規定する。
M08700 - SEMI M87 - Test Method for Contactless Resistivity Measurement of Semi-Insulating Semiconductors Revision:SEMI M87-0116 - Superseded together with test methods suitableThe purpose of this Test Method is to specify methods for the contactless measurement of the resistivity of semi insulating samples and wafers. This Test Method covers the determination of the electrical resistivity of semi insulating semiconductors, including GaAs, InP, CdTe, Cd(Zn)Te, SiC, GaN, and AlN, within the resistivity range 1E5 to 1E12 cm. It may also be used to characterize other materials exhibiting resistivity in this range, including in
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