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G06200 - SEMI G62 - Test Method for Silver Plating Quality StdPbc-0618 This Test Method applies to

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Description

This Test Method applies to all type of high purity gas delivery systems used in semiconductor manufacturing facilities and comparable research and development areas

It is well known that oxygen precipitates are also a source of gate oxide defects

This Standard does not require

9-0698 (first published)

G06200 - SEMI G62 - Test Method for Silver Plating Quality StdPbc-0618 This Test Method applies toThis Test Method describes procedures to determine silver plating quality. These methods apply to silver plating on leadframes for plastic packages. Applicable plating styles are listed in Table 1. Referenced SEMI StandardsSEMI G55 Test Method for Measurement of Silver Plating Brightness SEMI G56 Test Method for Measurement of Silver Plating Thickness

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